Proton Direct Ionization in Sub-Micron Technologies: Test Methodologies and Modeling

Two different low-energy proton (LEP) test methods, one with quasi-monoenergetic (QME) and the other very wide beam energy spectra, have been studied. The two methodologies applied to devices that were suggested from prior heavy-ion tests be sensitive direct ionization (PDI). advantages disadvantages of methods are discussed. method using QME beams requires device preparation high-energy resolution beams, but delivers results can interpreted directly used in various soft error rate (SER) calculation methods. method, a heavily degraded (DHEP) beam, little no more efforts on characterization, is confined specific SER method. While both deliver comparable estimates SER, relatively complex determination characteristics makes it less straightforward use. This work furthers presents extract PDI volume (SV) parameters DHEP cross Section data. extends use previously published LEP testing